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Probing dielectric properties of metal-organic frameworks: MIL-53(Al) as a model system for theoretical predictions and experimental measurements via synchrotron far- and mid-infrared spectroscopy.

Abstract:

Emerging nanoporous materials, such as metal-organic frameworks (MOFs), are promising low-k dielectrics central to next-generation electronics and high-speed communication. Hitherto, the dielectric characterization of MOFs is scarce, with very limited experimental data for guiding new materials design and synthesis. Herein we demonstrate the efficacy of highresolution synchrotron infrared (IR) specular reflectance experiments, to study the dynamic dielectric properties of a flexible MOF struc...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1021/acs.jpclett.7b02003

Authors


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Institution:
University of Oxford
Division:
MPLS Division
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS Division
Department:
Engineering Science
Role:
Author
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Balliol College Scholarship More from this funder
Samsung GRO More from this funder
Publisher:
American Chemical Society Publisher's website
Journal:
Journal of Physical Chemistry Letters Journal website
Volume:
8
Issue:
20
Pages:
5035-5040
Publication date:
2017-09-27
Acceptance date:
2017-09-27
DOI:
EISSN:
1948-7185
Pmid:
28953390
Source identifiers:
732941
Language:
English
Keywords:
Pubs id:
pubs:732941
UUID:
uuid:12b20d60-31c9-46bf-905e-7b8c684b9c99
Local pid:
pubs:732941
Deposit date:
2017-11-11

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