Journal article icon

Journal article

Advanced strain analysis by high energy synchrotron X-ray diffraction

Abstract:

Diffraction experiments using high energy, high intensity synchrotron X-ray beams are a powerful method of compiling two or three-dimensional orientation and phase-specific scans of the lattice parameter. This information can be converted into strain and stress maps of high accuracy and resolution, and used for the validation of numerical models of deformation. The present paper describes the use of monochromatic and white beam configurations at ESRF, Grenoble and SRS, Daresbury to study prob...

Expand abstract
Publication status:
Published
Peer review status:
Peer reviewed

Actions


Access Document


Authors


More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
Publisher:
Trans Tech Publications Publisher's website
Journal:
Materials Science Forum Journal website
Volume:
404-407
Pages:
329-334
Publication date:
2002-01-01
DOI:
ISSN:
0255-5476
Language:
English
Keywords:
Subjects:
UUID:
uuid:12f70365-5e2f-4605-b902-bcebb1a48a84
Local pid:
ora:4803
Deposit date:
2011-01-12

Terms of use


Views and Downloads






If you are the owner of this record, you can report an update to it here: Report update to this record

TO TOP