Working paper
Coherent X-ray measurements of ion-implantation-induced lattice strains in nano-crystals
- Abstract:
-
Focussed Ion Beam (FIB) milling is a mainstay of nano-scale machining. By manipulating a tightly focussed beam of energetic ions, often gallium (Ga+), FIB can sculpt nanostructures via localised sputtering. This ability to cut solid matter on the nano-scale has revolutionised sample preparation across the life-, earth- and materials sciences. For example FIB is central to microchip prototyping, 3D material analysis, targeted electron microscopy sample extraction and the nanotechnology behin...
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- Publication status:
- Not published
- Peer review status:
- Not peer reviewed
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Authors
Funding
+ Engineering and Physical Sciences Research Council
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Funding agency for:
Tarleton, E
Grant:
EP/N007239/1
EP/I022562/1
+ Australian Research Council Centre of Excellence in Advanced Molecular Imaging
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Grant:
CE140100011
Volkswagen Foundation
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Bibliographic Details
- Publisher:
- arXiv Publisher's website
- Series:
- arXiv
- Publication date:
- 2016-03-01
Item Description
- Keywords:
- Pubs id:
-
pubs:622379
- UUID:
-
uuid:1e852529-6d61-4538-982d-fd91e99aa9a5
- Local pid:
- pubs:622379
- Source identifiers:
-
622379
- Deposit date:
- 2016-05-16
Terms of use
- Copyright date:
- 2016
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