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Atomic level structural and chemical analysis of Cr-doped Bi₂Se₃

Abstract:

We present a study of the structure and chemical composition of the Cr-doped 3D topological insulator Bi2Se3. Single-crystalline thin films were grown by molecular beam epitaxy on Al2O3 (0001), and their structural and chemical properties determined on an atomic level by aberration-corrected scanning transmission electron microscopy and electron energy loss spectroscopy. A regular quintuple layer stacking of the Bi2Se3 film is found, with the exception of the first several atomic layers in th...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1038/srep26549

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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Role:
Author
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Institution:
University of Oxford
Division:
MPLS
Department:
Physics
Sub department:
Condensed Matter Physics
Role:
Author
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Funding agency for:
Lazarov, V
Grant:
EP/K03278X/1
John Fell Fund More from this funder
Publisher:
Nature Publishing Group Publisher's website
Journal:
Scientific Reports Journal website
Volume:
6
Article number:
26549
Publication date:
2016-01-01
Acceptance date:
2016-05-04
DOI:
ISSN:
2045-2322
Source identifiers:
619292
Pubs id:
pubs:619292
UUID:
uuid:3eea349a-9b98-49b9-a27d-6201624a824c
Local pid:
pubs:619292
Deposit date:
2016-05-04

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