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Characterization of Amorphous Materials by Electron Diffraction and Atomistic Modeling.

Abstract:
The technique of energy selected electron diffraction gives information about amorphous structures which can be used to characterize amorphous materials in terms of their structure. The diffraction data can be used to refine models obtained using molecular dynamics, resulting in physically reasonable models consistent with the diffraction data.
Publication status:
Published

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Institution:
University of Oxford
Division:
MPLS
Department:
Materials
Role:
Author
Journal:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Volume:
6
Issue:
4
Pages:
329-334
Publication date:
2000-07-01
EISSN:
1435-8115
ISSN:
1431-9276
Language:
English
Keywords:
Pubs id:
pubs:9409
UUID:
uuid:406953b6-4f0f-4681-8e58-df3f52640a69
Local pid:
pubs:9409
Source identifiers:
9409
Deposit date:
2012-12-19

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