Journal article
Characterization of Amorphous Materials by Electron Diffraction and Atomistic Modeling.
- Abstract:
- The technique of energy selected electron diffraction gives information about amorphous structures which can be used to characterize amorphous materials in terms of their structure. The diffraction data can be used to refine models obtained using molecular dynamics, resulting in physically reasonable models consistent with the diffraction data.
- Publication status:
- Published
Actions
Authors
Bibliographic Details
- Journal:
- Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
- Volume:
- 6
- Issue:
- 4
- Pages:
- 329-334
- Publication date:
- 2000-07-01
- EISSN:
-
1435-8115
- ISSN:
-
1431-9276
Item Description
- Language:
- English
- Keywords:
- Pubs id:
-
pubs:9409
- UUID:
-
uuid:406953b6-4f0f-4681-8e58-df3f52640a69
- Local pid:
- pubs:9409
- Source identifiers:
-
9409
- Deposit date:
- 2012-12-19
Terms of use
- Copyright date:
- 2000
Metrics
If you are the owner of this record, you can report an update to it here: Report update to this record