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Journal article

The three-dimensional microstructure of polycrystalline materials unravelled by synchrotron light

Abstract:

Synchrotron radiation X-ray imaging and diffraction techniques offer new possibilities for non-destructive bulk characterization of polycrystalline materials. Minute changes in electron density (different crystallographic phases, cracks, porosities) can be detected using 3D imaging modes exploiting Fresnel diffraction and the coherence properties of third generation synchrotron beams. X-ray diffraction contrast tomography, a technique based on Bragg diffraction imaging, provides access to the...

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Journal:
Actualite Chimique
Issue:
356-357
Pages:
62-67
Publication date:
2011-10-01
ISSN:
0151-9093
Source identifiers:
216527
Language:
French
Keywords:
Pubs id:
pubs:216527
UUID:
uuid:419380f6-8d40-4d2f-b272-9a5bf1d8758d
Local pid:
pubs:216527
Deposit date:
2012-12-19

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