Journal article
Defect-enhanced electron field emission from chemical vapor deposited diamond
- Abstract:
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Diamond samples with varying defect densities have been synthesized by chemical vapor deposition, and their field emission characteristics have been investigated. Vacuum electron field emission measurements indicate that the threshold electric field required to generate sufficient emission current densities for flat panel display applications (>10 mA/cm²) can be significantly reduced when the diamond is grown so as to contain a substantial number of structural defects. The defective diamon...
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- Publication status:
- Published
- Peer review status:
- Peer reviewed
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(Version of record, pdf, 592.0KB)
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- Publisher copy:
- 10.1063/1.360066
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Authors
Bibliographic Details
- Publisher:
- American Insitute of Physics Publisher's website
- Journal:
- Journal of Applied Physics Journal website
- Volume:
- 78
- Issue:
- 4
- Pages:
- 2707-2711
- Publication date:
- 1995-08-01
- DOI:
- EISSN:
-
1089-7550
- ISSN:
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0021-8979
Item Description
- Language:
- English
- Keywords:
- Subjects:
- UUID:
-
uuid:55642c7d-945b-4818-b068-bba7a0885feb
- Local pid:
- ora:1449
- Deposit date:
- 2008-03-14
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Terms of use
- Copyright holder:
- American Institute of Physics
- Copyright date:
- 1995
- Notes:
- Dr Kochanski is now based at the University of Oxford Phonetics Laboratory. Citation: Zhu, W. et al. (1995). 'Defect-enhanced electron field emission from chemical vapor deposited diamond', Journal of Applied Physics, 78(4), 2707-2711. [Available at http://jap.aip.org/].
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