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Defect-enhanced electron field emission from chemical vapor deposited diamond

Abstract:

Diamond samples with varying defect densities have been synthesized by chemical vapor deposition, and their field emission characteristics have been investigated. Vacuum electron field emission measurements indicate that the threshold electric field required to generate sufficient emission current densities for flat panel display applications (>10 mA/cm²) can be significantly reduced when the diamond is grown so as to contain a substantial number of structural defects. The defective diamon...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1063/1.360066

Authors


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Institution:
"AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey, USA"
Role:
Author
More by this author
Institution:
"AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey, USA"
Role:
Author
More by this author
Institution:
"AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey, USA"
Role:
Author
More by this author
Institution:
"AT&T Bell Laboratories, 600 Mountain Avenue, Murray Hill, New Jersey, USA"
Role:
Author
Publisher:
American Insitute of Physics Publisher's website
Journal:
Journal of Applied Physics Journal website
Volume:
78
Issue:
4
Pages:
2707-2711
Publication date:
1995-08-01
DOI:
EISSN:
1089-7550
ISSN:
0021-8979
Language:
English
Keywords:
Subjects:
UUID:
uuid:55642c7d-945b-4818-b068-bba7a0885feb
Local pid:
ora:1449
Deposit date:
2008-03-14

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