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Intergranular lattice misorientation mapping by synchrotron x-ray micro-beams: Laue vs energy-resolved Laue vs monochromatic reciprocal space analysis

Abstract:

Laue diffraction, energy scanning and reciprocal space mapping are three micro-beam synchrotron X-ray diffraction techniques allowing the investigation of local misorientation induced by the dislocation substructure. In this paper a comparison between the three methods is presented, based on the mapping of a single 311 reflection from a grain within a Ni polycrystal specimen deformed to a tensile plastic strain of ~9%. Qualitatively it is observed that the maps obtained by different techni...

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Publication status:
Published
Peer review status:
Peer reviewed

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Publisher copy:
10.1142/S0217979210064216

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Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
More by this author
Institution:
Diamond Light Source, Didcot, UK
Role:
Author
More by this author
Institution:
University of Oxford
Division:
MPLS
Department:
Engineering Science
Role:
Author
Engineering and Physical Sciences Research Council More from this funder
Publisher:
World Scientific Publishing Company Publisher's website
Journal:
International Journal of Modern Physics B Journal website
Volume:
24
Issue:
1-2
Pages:
279-287
Publication date:
2010-01-01
DOI:
EISSN:
1793-6578
ISSN:
0217-9792
Language:
English
Keywords:
Subjects:
UUID:
uuid:62e82e17-92ab-4426-9b41-77fd94ec84c2
Local pid:
ora:7890
Deposit date:
2014-02-03

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