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Thesis

Atomic study of defects in two-dimensional transition metal chalcogenides using electron microscopy

Abstract:

Two-dimensional (2D) transition metal dichalcogenides (TMDs) are layered semiconductors with unique electronic and optical properties which have shown immense potential in ultrathin (opto-)electronic devices. Structural defects that are ubiquitous in 2D materials have demonstrated to exert significant impacts on the materials’ properties. The in-depth comprehension of structural defects at the atomic level is vital for the rational exploration of their exceptional properties, which is the ...

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Division:
MPLS
Department:
Materials
Sub department:
Materials
Oxford college:
Oriel College
Role:
Author
ORCID:
https://orcid.org/0000-0001-9616-6299

Contributors

Role:
Supervisor
Type of award:
DPhil
Level of award:
Doctoral
Awarding institution:
University of Oxford
Language:
English
Keywords:
Subjects:
Deposit date:
2021-08-13

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